Analysis with
microscope
SEM
Identify any defects, contamination, anomalies of your component with Alticolor's scanning electron microscope (SEM).
The functionalities of the SEM microscope
- 01.
Defining the composition of the component, identifying any defects, failure points, contamination, anomalies (failure analysis), measuring the roughness value and crater depth.
- 02.
Extreme accuracy using energy dispersive spectrometry (EDS) system and a cathodoluminescence detector (SEM-CL).
- 03.
3D surface analysis with metrological functionality
- 04.
Fast and reliable analysis due to ease of use and reduced sample preparation, reducing downtime and optimizing quality control processes.
- 05.
Measurable results in terms of component compliance.